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Gaál, Z. T.,
Halász, Z.,
Csik, A.,
Takáts, V.,
Nagy, G.,
Oscarsson, J.,
Sortica, M.,
Primetzhofer, D.,
Fodor, T.,
Molnár, S.,
Hakl, J.,
Benkó, Z.,
Daróczi, L.,
Benke, M.,
Vad, K.,
Rajta, I.:
Boron depth distribution in iron surfaces at high-dose implantation.
Vacuum. 238, 1-6, (article identifier: 114310), 2025.
Takáts, V.,
Fodor, T.,
Gaál, Z. T.,
Halász, Z.,
Hakl, J.,
Molnár, S.,
Csik, A.,
Nagy, G.,
Sortica, M.,
Oscarsson, J.,
Primetzhofer, D.,
Benke, M.,
Rajta, I.,
Vad, K.:
Chemical state depth distribution of boron in high-dose implanted iron surface.
Surf. Coat. Technol. 509, 1-6, (article identifier: 132162), 2025.
Szívós, J.,
Balogh, L.,
Rajta, I.,
Nagy, G.,
Gaál, Z. T.,
Samu, V.,
Takefumi, K.,
Zolnai, Z.:
Monitoring of Dose Dependent Damage in MeV Energy Hydrogen Implanted Silicon by Photo-Modulated Reflectance Measurements.
IEEE J. Electron Devices Soc. 10, 761-768, 2022.
Nagy, G.,
Gaál, Z. T.,
Rajta, I.,
Tőkési, K.:
Spatial and temporal distribution of a 1-MeV proton microbeam guided through a poly(tetrafluoroethylene) macrocapillary.
Phys. Rev. A. 103 (4), 1-12, (article identifier: 042801), 2021.
