The library will operate on a duty schedule between 22 December 2025 and 4 January 2026. During this period, it will be possible to upload publications, but all other services will be suspended.
Gaál, Z. T.,
Halász, Z.,
Csik, A.,
Takáts, V.,
Nagy, G.,
Oscarsson, J.,
Sortica, M.,
Primetzhofer, D.,
Fodor, T.,
Molnár, S.,
Hakl, J.,
Benkó, Z.,
Daróczi, L.,
Benke, M.,
Vad, K.,
Rajta, I.:
Boron depth distribution in iron surfaces at high-dose implantation.
Vacuum. 238, 1-6, (article identifier: 114310), 2025.
Molnár, S.,
Bohdan, R.,
Nagy, G.,
Rajta, I.,
Illés, L.,
Csik, A.,
Kökényesi, S.:
Direct surface patterning of amorphous chalcogenide layers with high- energy H+ and He+ ion beams.
J. Mater. Sci.-Mater. Electron. 30 (16), 15331-15338, 2019.
Molnár, S.,
Bohdan, R.,
Takáts, V.,
Kaganovskii, Y. S.,
Vad, K.,
Kökényesi, S.:
Kinetics of photo-darkening and -bleaching in amorphous As20Se80 layers: temperature dependence.
J. Optoelectron. Adv. Mater. 20 (11-12), 646-650, 2018.
Csarnovics, I.,
Veres, M.,
Nemec, P.,
Latif, M. R.,
Hawlova, P.,
Molnár, S.,
Kökényesi, S.:
Surface patterning in Ge-Se amorphous layers.
J. Non-Cryst. Solids. 459, 51-56, 2017.
Molnár, S.,
Bohdan, R.,
Csarnovics, I.,
Burunkova, J.,
Kökényesi, S.:
Amorphous chalcogenide layers and nanocomposites for direct surface patterning.
In: Optical Components and Materials XII.. Ed.: Shibin Jiang, Michel J. F. Digonnet, SPIE, Bellingham, Wash., 1-10, 2015.
Bohdan, R.,
Molnár, S.,
Kökényesi, S.:
Methods comparing peculiarities of surface-relief recording in amorphous chalcogenides.
Phys. Status Solidi A. Appl. Mat. 212 (10), 2186-2190, 2015.
Bohdan, R.,
Molnár, S.,
Csarnovics, I.,
Veres, M.,
Csik, A.,
Kökényesi, S.:
Optical recording of surface relief on amorphous selenium.
J. Non-Cryst. Solids. 408, 57-61, 2015.
Csarnovics, I.,
Molnár, S.,
Burunkova, J.,
Žuk, D. I.,
Denisiuk, I.,
Bonyár, A.,
Cserháti, C.,
Kökényesi, S.:
Patterning photosensitive layers for optoelectronic applications.
In: 38th International Spring Seminar on Electronics Technology (ISSE). Ed.: H. Wohlrabe, O. Krammer, J. Nicolics, M. Franz, IEEE, New York, 57-60, 2015. ISBN: 9781479988600