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External Department of Electrical Manufacturing and Measurements

External Department of Electrical Manufacturing and Measurements
External Department of Electrical Manufacturing and Measurements
Uploaded publications:
7
Publications in DEA:
7
OA:
6
Date range:
2016-2025
2025
1.
Mukherjee, D., Kertész, K., Zolnai, Z., Kovács, Z., Deák, A., Pálinkás, A., Osváth, Z., Olasz, D., Romanenko, A., Fried, M., Burger, S., Sáfrán, G., Petrik, P.: Optimized sensing on gold nanoparticles created by graded-layer magnetron sputtering and annealing.
Sens. Actuator B-Chem. 425, 1-9, (article identifier: 136875), 2025.
Journal metrics:
D1 Analytical Chemistry (2024)
D1 Condensed Matter Physics (2024)
Q1 Electrical and Electronic Engineering (2024)
Q1 Electrochemistry (2024)
Q1 Electronic, Optical and Magnetic Materials (2024)
D1 Instrumentation (2024)
D1 Materials Chemistry (2024)
D1 Metals and Alloys (2024)
D1 Spectroscopy (2024)
D1 Surfaces, Coatings and Films (2024)
2024
2.
Khánh, N. Q., Horváth, Z. E., Zolnai, Z., Petrik, P., Pósa, L., Volk, J.: Effect of process parameters on co-sputtered Al(1-x)ScxN layer`s properties: Morphology, crystal structure, strain, band gap, and piezoelectricity.
Mater. Sci. Semicond. Process. 169, 1-9, (article identifier: 107902), 2024.
Journal metrics:
Q1 Condensed Matter Physics
Q2 Materials Science (miscellaneous)
Q1 Mechanical Engineering
Q1 Mechanics of Materials
3.
Szekeres, A., Alexandrova, S., Anastasescu, M., Stroescu, H., Gartner, M., Petrik, P.: Optical and Morphological Characterization of Nanoscale Oxides Grown in Low-Energy H+-Implanted c-Silicon.
Micro. 4 (3), 426-441, 2024.
2023
4.
Mukherjee, D., Kalas, B., Burger, S., Sáfrán, G., Serényi, M., Fried, M., Petrik, P.: Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry.
Proc. SPIE. 12428, 1-9, (article identifier: 124280), 2023.
5.
Mukherjee, D., Petrik, P.: Real-Time Ellipsometry at High and Low Temperatures.
ACS Omega. 8 (4), 3684-3697, 2023.
Journal metrics:
Q2 Chemical Engineering (miscellaneous)
Q2 Chemistry (miscellaneous)
2022
6.
Pineau, E., Grynko, O., Thibault, T., Alexandrov, A., Csík, A., Kökényesi, S., Reznik, A.: Comparative Analysis of Multilayer Lead Oxide-Based X-ray Detector Prototypes.
Sensors. 22 (16), 1-16, 2022.
Journal metrics:
Q1 Analytical Chemistry
Q2 Atomic and Molecular Physics, and Optics
Q2 Biochemistry
Q2 Electrical and Electronic Engineering
Q2 Information Systems
Q1 Instrumentation
Q2 Medicine (miscellaneous)
2016
7.
Sarvajcz, K., Váradiné Szarka, A.: Development of portable measuring system for testing of electrical vehicle's heat energy recovery system.
J. Phys. Conf. Ser. 772, 1-6, 2016.
Journal metrics:
Q3 Physics and Astronomy (miscellaneous)
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